Huei-Jyun Shih

Atomic structure of an impurity-stabilized Si{111} surface: Refinement using a combined-layer method

D. W. Jepsen, Huei-Jyun Shih, F. Jona et al. · Physical review. B, Condensed matter · 1980 · 106 citations

Engineering, Electron Diffraction, Silicon On Insulator +18

Atomic underlayer formation during the reaction of Ti{0001} with nitrogen

Huei-Jyun Shih, F. Jona, D. W. Jepsen et al. · Surface Science · 1976 · 96 citations

Materials Science, Surface Characterization, Engineering +9

The structure of the clean Mo[001] surface

A. Ignatiev, F. Jona, Huei-Jyun Shih et al. · Physical review. B, Solid state · 1975 · 90 citations

Materials Science, Clean Mo, Ordered Overlayers +14

Low-Energy Electron Diffraction Determination of the Atomic Arrangement on Impurity-Stabilized Unreconstructed Si{111} Surfaces

Huei-Jyun Shih, F. Jona, D. W. Jepsen et al. · Physical Review Letters · 1976 · 86 citations

Engineering, Atomic Arrangement, Silicon On Insulator +18

On the structure of reconstructed Si(001)2×1 and Ge(001)2×1 surfaces

F. Jona, Huei-Jyun Shih, D. W. Jepsen et al. · Journal of Physics C Solid State Physics · 1979 · 70 citations

Materials Science, Surface Characterization, Surface-dimer Model +13