Ramakrishnan Vaidyanathan

Control of Defect Concentrations within a Semiconductor through Adsorption

Edmund G. Seebauer, Kapil Dev, Michael Y. L. Jung et al. · Physical Review Letters · 2006 · 47 citations

Semiconductors, Materials Science, Engineering +13

Mechanism and energetics of self-interstitial formation and diffusion in silicon

Ramakrishnan Vaidyanathan, Michael Y. L. Jung, Edmund G. Seebauer · Physical Review B · 2007 · 16 citations

Materials Science, Engineering, Physics +13

Measurement of defect‐mediated diffusion: The case of silicon self‐diffusion

Ramakrishnan Vaidyanathan, Michael Y. L. Jung, Richard D. Braatz et al. · AIChE Journal · 2005 · 14 citations

Materials Science, Engineering, Diffusion Resistance +9

Influence of surface adsorption in improving ultrashallow junction formation

Ramakrishnan Vaidyanathan, Edmund G. Seebauer, H. Graoui et al. · Applied Physics Letters · 2006 · 11 citations

Engineering, Integrated Circuits, Silicon On Insulator +16

Defect engineering by surface chemical state in boron-doped preamorphized silicon

S. H. Yeong, Madhavi Srinivasan, B. Colombeau et al. · Applied Physics Letters · 2007 · 10 citations

Materials Science, Electrical Engineering, Engineering +15