Osami Horibe

Influence of Counter-Layer Deposition Condition on Critical Current Spread in Interface-Modified Ramp-Edge Junction Arrays

H. Wakana, Seiji Adachi, Masahiro Horibe et al. · Japanese Journal of Applied Physics · 2002 · 36 citations

Engineering, Laser Applications, Optoelectronic Devices +18

Observation of Barrier Recrystallization Process and Properties of Ramp-Edge Josephson Junctions with Interface-Modified Barrier

Yoshihiro Ishimaru, Yuan Wu, Osami Horibe et al. · Japanese Journal of Applied Physics · 2002 · 22 citations

Engineering, Barrier Recrystallization Process, Josephson Junctions +16

Fabrication and Logic Operation of Oxide SFQ-Circuit-Components

Y. Tarutani, Yoshihiro Ishimaru, H. Wakana et al. · IEEE Transactions on Applied Superconductivity · 2005 · 21 citations

Engineering, Vlsi Design, Double Squids +16

Progress in HTS sampler development

Hideo Suzuki, Tsunehiro Hato, Michitaka Maruyama et al. · Physica C Superconductivity · 2005 · 17 citations

Measurement, Data Acquisition, Education +4

New type of SFQ-dc converter for use in oxide circuits

Y. Tarutani, Yoshihiro Ishimaru, H. Wakana et al. · Physica C Superconductivity · 2004 · 13 citations

Electrical Engineering, Engineering, Power Device +6