Statistics
Publications
1
Citations
13
H-Index
1
Active since
2013
陈凡 is an author specializing in device reliability, electronic materials, and device simulation.
Publications per year
2013–2013
1
1
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
祁楠, 陈凡, 张凌炜 et al. · 半导体学报：英文版 · 2013 · 13 citations
Engineering, Computer Engineering, Electrical Engineering +13
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