R. G. Beck

Cryogenic scanning probe characterization of semiconductor nanostructures

M. A. Eriksson, R. G. Beck, M. A. Topinka et al. · Applied Physics Letters · 1996 · 152 citations

Engineering, Ballistic Point Contact, Microscopy +16

GaAs/AlGaAs self-sensing cantilevers for low temperature scanning probe microscopy

R. G. Beck, M. A. Eriksson, M. A. Topinka et al. · Applied Physics Letters · 1998 · 86 citations

Electrical Engineering, Electronic Instrumentation, Engineering +14

Using soft lithography to fabricate GaAs/AlGaAs heterostructure field effect transistors

Junmin Hu, R. G. Beck, Tao Deng et al. · Applied Physics Letters · 1997 · 57 citations

Engineering, Electron-beam Lithography, Integrated Circuits +16

Strain-sensing cryogenic field-effect transistor for integrated strain detection in GaAs/AlGaAs microelectromechanical systems

R. G. Beck, M. A. Eriksson, R. M. Westervelt et al. · Applied Physics Letters · 1996 · 38 citations

Semiconductor Technology, Electron Density, Electrical Engineering +13

The Use of Soft Lithography to Fabricate Arrays of Schottky Diodes

Junmin Hu, R. G. Beck, Robert M. Westervelt et al. · Advanced Materials · 1998 · 32 citations

Engineering, Electron-beam Lithography, Wafer Scale Processing +18