Sampo Backman is an author at University of Oulu specializing in instrumentation, inspection, and ophthalmology.
Top concepts
RadiologyInspectionCalibrationEngineeringOphthalmologyImage AnalysisMachine VisionInstrumentationComputer ScienceSoftware Testing
Publications per year
2004–2004
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Random target method for fast MTF inspection
Sampo Backman, Anssi Mäkynen, Timo T. Kolehmainen et al. · Optics Express · 2004 · 34 citations · Full text
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