J. Lenaerts

Excimer formation in argon, krypton, and xenon discharge afterglows between 200 and 400 K

W. Wieme, J. Lenaerts · The Journal of Chemical Physics · 1981 · 54 citations

Engineering, Nuclear Physics, Glow Discharge +19

Matrix‐enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films

L. Adriaensen, F. Vangaever, J. Lenaerts et al. · Rapid Communications in Mass Spectrometry · 2005 · 40 citations

Engineering, Biological Mass Spectrometry, Organic Chemistry +21

Application of laser ablation inductively coupled plasma (dynamic reaction cell) mass spectrometry for depth profiling analysis of high-tech industrial materials

Lieve Balcaen, J. Lenaerts, Luc Moëns et al. · Journal of Analytical Atomic Spectrometry · 2005 · 26 citations

Engineering, Mechanical Engineering, Blasting +19

A general consistent model for formation and decay of rare gas excimers in the 10−2–10+5 mbar pressure range, with application to krypton

H. Janssens, M. Vanmarcke, Eric Desoppere et al. · The Journal of Chemical Physics · 1987 · 22 citations

Engineering, Nuclear Physics, Atomic Emission Spectroscopy +18

Quenching of excited Xe* (3<i>P</i>2, 3<i>P</i>1, 1<i>P</i>1) states in a neon–xenon mixture

W. Wieme, J. Lenaerts · The Journal of Chemical Physics · 1980 · 13 citations

Chemical Kinetics, Localized Excited State, X-ray Spectroscopy +16