Yi‐Chin Chu is an author at Stanford University specializing in reliability engineering, computer engineering, and electrical engineering.
Top concepts
EngineeringReliabilityMicroelectronicsSoftware TestingDesign For TestingComputer EngineeringElectrical EngineeringReliability EngineeringDiagnosisVlsi Design
Publications per year
2002–2002
2
2
Experimental results for IDDQ and VLV testing
J.T.-Y. Chang, Chao-Wen Tseng, Yi‐Chin Chu et al. · 2002 · 32 citations
Engineering, Mem Testing, Diagnosis +19
Analysis and detection of timing failures in an experimental Test Chip
P. Franco, Siyad Ma, Jeremy Chang et al. · 2002 · 22 citations
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