M. V. V. S. Subrahmanyam is an author at Engineers India (India) specializing in pattern recognition, engineering, and feature detection.
Top concepts
EngineeringPattern RecognitionDiagnosisBiometricsImage AnalysisMachine VisionComputer VisionFault DiagnosisImage RetrievalObject Tracking
Publications per year
1997–2011
2
2
Rows per page
1–2 of 2