T. Meoded

Potential imaging of operating light-emitting devices using Kelvin force microscopy

Rafi Shikler, T. Meoded, N. Fried et al. · Applied Physics Letters · 1999 · 84 citations

Engineering, Microscopy, Nanometer Spatial Resolution +18

Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy

T. Meoded, Rafi Shikler, N. Fried et al. · Applied Physics Letters · 1999 · 51 citations

Engineering, Microscopy, Charge Transport +18

Two-dimensional surface band structure of operating light emitting devices

Rafi Shikler, T. Meoded, N. Fried et al. · Journal of Applied Physics · 1999 · 51 citations

Electrical Engineering, Nanometer Spatial Resolution, Potential Distribution +13

Measuring minority-carrier diffusion length using a Kelvin probe force microscope

Rafi Shikler, N. Fried, T. Meoded et al. · Physical review. B, Condensed matter · 2000 · 50 citations

Engineering, Measurement, Microscopy +21

Physical properties of a:DLC films and their dependence on parameters of deposition and type of substrate

M. Maharizi, Ori Segal, Eshel Ben‐Jacob et al. · Diamond and Related Materials · 1999 · 12 citations

Materials Science, Engineering, Surface Science +8