David Ortega-delCampo is an author at Universidad Rey Juan Carlos specializing in pattern recognition, engineering, and biometrics.
Top concepts
BiometricsEngineeringComputer SciencePattern RecognitionDeep LearningImage AnalysisMachine VisionComputer VisionMachine LearningComputer Engineering
Publications per year
2020–2020
3
3
M. Araceli Sánchez-Sánchez, Cristina Conde, Beatriz Gómez-Ayllón et al. · Entropy · 2020 · 13 citations · Full text
Convolutional Neural Network, Engineering, Machine Learning +22
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1–3 of 3