Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Lorenzo Mancini, Nooshin Amirifar, Deodatta Shinde, +17

The Journal of Physical Chemistry C

EngineeringChemical CompositionAtom Probe TomographySurface Electric FieldNanostructures Measured +15

Evidence of Superparamagnetic Co Clusters in Pulsed Laser Deposition-Grown Zn_0.9Co_0.1O Thin Films Using Atom Probe Tomography

R. Lardé, Etienne Talbot, P. Pareige, +5

Journal of the American Chemical Society

EngineeringCrystal Growth TechnologyMagnetic ResonanceMagnetoresistanceMagnetism +18

Si nanoparticles in SiO₂An atomic scale observation for optimization of optical devices

Etienne Talbot, R. Lardé, F. Gourbilleau, +2

Europhysics Letters (EPL)

Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica

Etienne Talbot, R. Lardé, P. Pareige, +3

Nanoscale Research Letters

Optical MaterialsEngineeringOptoelectronic DevicesChemistrySilicon On Insulator +18

Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters

Nooshin Amirifar, R. Lardé, Etienne Talbot, +11

Journal of Applied Physics

EngineeringMicroscopyChemical CompositionAtom Probe TomographyZinc Oxide +14

High- and low-frequency behaviour of response functions in a Bose liquid: One-loop approximation

Etienne Talbot, Allan Griffin

Annals of Physics

One-loop ApproximationQuantum ScienceQuantum LiquidEngineeringPhysics +6

Influence of the supersaturation on Si diffusion and growth of Si nanoparticles in silicon-rich silica

Manuel Roussel, Etienne Talbot, P. Pareige, +1

Journal of Applied Physics

EngineeringSi DiffusionSilicon On InsulatorNanoelectronicsSi Nanoparticles +15

Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide

R. Lardé, Etienne Talbot, F. Vurpillot, +5

Journal of Applied Physics

Magnetic SemiconductorMagnetic PropertiesEngineeringMagnetic ResonanceChemistry +16

Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography

Manuel Roussel, Etienne Talbot, F. Gourbilleau, +1

Nanoscale Research Letters

Phase transformation in SiOx/SiO2 multilayers for optoelectronics and microelectronics applications

Manuel Roussel, Etienne Talbot, R. Pratibha Nalini, +2

Ultramicroscopy

Materials ScienceElectrical EngineeringEngineeringNanotechnologySurface Science +7