K. Nishitani

Analysis of GTO failure mode during DC voltage blocking

Hideo Matsuda, Tsuyoshi Fujiwara, Michiaki Hiyoshi et al. · 2002 · 31 citations

Electrical Engineering, Reliability Engineering, Engineering +7

Photo/EB hybrid exposure process for T-shaped gate superlow-noise HEMTs

K. Hosogi, Nobumasa Nakano, H. Minami et al. · Electronics Letters · 1991 · 31 citations

High Performance Hemts, Electrical Engineering, Engineering +11

A 2.2-V operation, 2.4-GHz single-chip GaAs MMIC transceiver for wireless applications

Kazuya Yamamoto, Toshimoto Moriwaki, T. Fujii et al. · IEEE Journal of Solid-State Circuits · 1999 · 27 citations

Low-power Electronics, Electrical Engineering, Negative Voltage Generator +12

Lpe growth of Hgl−xCdxTe using conventional slider boat and effects of annealing on properties of the epilayers

K. Nagahama, R. Ohkata, K. Nishitani et al. · Journal of Electronic Materials · 1984 · 24 citations

Materials Engineering, Materials Science, Conventional Slider Boat +2

Super low-noise self-aligned gate GaAs MESFET with noise figure of 0.87 dB at 12 GHz

K. Hosogi, N. Ayaki, T. Kato et al. · 2002 · 21 citations

Electrical Engineering, Engineering, Rf Semiconductor +13