Statistics
Publications
1
Citations
12
H-Index
1
Active since
1987
Affiliations
Toshiba (Japan)(Current)
N. Yasuhisa is an author at Toshiba (Japan) specializing in gate leakage current, gate oxide reliability, and oxide reliability.
Publications per year
1987–1987
1
1
Highly Reliable Trench Capacitor With SiO2/Si3N4/SiO2 Stacked Film
Takeshi Watanabe, N. Goto, N. Yasuhisa et al. · Reliability physics · 1987 · 12 citations
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