Concepedia

M. Bienias

MB

2

Publications

54

Citations

2

H-Index

1997

Active since

Affiliations

Physikalisch-Technische Bundesanstalt(Current)

National Institute of Metrology

M. Bienias is an author at Physikalisch-Technische Bundesanstalt specializing in microscopy, metrology, and engineering.

Top concepts

MetrologyMicroscopyEngineeringMechanical EngineeringEducationKinematicsCalibrationMeasurementInterferometryMicrostructure

Publications per year

1997–1998

2

Publications

2

A metrological scanning force microscope used for coating thickness and other topographical measurements

M. Bienias, Sheng Gao, R. Seemann et al. · Applied Physics A · 1998 · 42 citations

Materials Science, Other Topographical Measurements, Engineering +9

3D Calibration of a Scanning Force Microscope with Internal Laser Interferometers

M. Bienias, Sheng Gao, R. Seemann et al. · Surface and Interface Analysis · 1997 · 12 citations

Sfm Measurements, Engineering, Microscopy +30

Rows per page

1–2 of 2