Concepedia
Statistics
Publications
1
Citations
18
H-Index
Active since
2016
James D. Schlenker is an author specializing in electron backscatter diffraction, x-ray diffraction, and spectroscopy.
Publications per year
2016–2016
Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis
Paweł Nowakowski, James D. Schlenker, Mary Ray et al. · Microscopy and Microanalysis · 2016 · 18 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +12
1–1 of 1