W. J. Daughton

Statistics

Publications

Citations

140

H-Index

Active since

1979

Affiliations

Texas Instruments (United States)(Current)

W. J. Daughton is an author at Texas Instruments (United States) specializing in film thickness, materials characterization, and film thickness measurement.

Publications per year

1979–1982

Publications

An Investigation of the Thickness Variation of Spun‐on Thin Films Commonly Associated with the Semiconductor Industry

W. J. Daughton, F. L. Givens · Journal of The Electrochemical Society · 1982 · 105 citations

Natural Sciences, Materials Engineering, Materials Science +14

On the Uniformity of Thin Films: A New Technique Applied to Polyimides

F. L. Givens, W. J. Daughton · Journal of The Electrochemical Society · 1979 · 35 citations

Natural Sciences, Materials Engineering, Materials Science +11

1–2 of 2