M. Shakeri

Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis

S. Deb, Krishna R. Pattipati, V. Raghavan et al. · IEEE Aerospace and Electronic Systems Magazine · 1995 · 208 citations

Fault Diagnosis, Engineering, Verification +22

Sequential testing algorithms for multiple fault diagnosis

M. Shakeri, V. Raghavan, Krishna R. Pattipati et al. · IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans · 2000 · 102 citations

Fault Diagnosis, Engineering, Verification +17

Optimal and near-optimal test sequencing algorithms with realistic test models

V. Raghavan, M. Shakeri, Krishna R. Pattipati · IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans · 1999 · 77 citations

Engineering, Diagnosis, Test Data Generation +17

Test sequencing algorithms with unreliable tests

V. Raghavan, M. Shakeri, Krishna R. Pattipati · IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans · 1999 · 57 citations

Engineering, Verification, Test Data Generation +25

Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis

S. Deb, Krishna R. Pattipati, V. Raghavan et al. · 2002 · 55 citations

Fault Diagnosis, Engineering, Verification +22