Manfred Kässens

Electron‐specimen interactions in low‐voltage scanning electron microscopy

R. Böngeler, Ute Golla, Manfred Kässens et al. · Scanning · 1993 · 99 citations

Engineering, Nuclear Physics, Microscopy +16

Contamination in a scanning electron microscope and the influence of specimen cooling

P. B. Hirsch, Manfred Kässens, M. Püttmann et al. · Scanning · 1994 · 68 citations

Materials Science, Electrical Engineering, Engineering +14

Calculation of energy spectra from layered structures for backscattered electron spectrometry and relations to rutherford backscattering spectrometry by ions

L. Reimer, R. Böngeler, Manfred Kässens et al. · Scanning · 1991 · 20 citations

Physics, Layered Structures, Backscattered Electron Spectrometry +11

Contrast of colloidal gold particles and thin films on a silicon substrate observed by backscattered electrons in a low-voltage scanning electron microscope

P. B. Hirsch, Manfred Kässens, L. Reimer et al. · Ultramicroscopy · 1993 · 12 citations

Materials Science, Engineering, Electron Microscopy +12