Andrew C. Hillier

Measurement of Double-Layer Forces at the Electrode/Electrolyte Interface Using the Atomic Force Microscope:  Potential and Anion Dependent Interactions

Andrew C. Hillier, Sunghyun Kim, Allen J. Bard · The Journal of Physical Chemistry · 1996 · 192 citations

Engineering, Electrode-electrolyte Interface, Microscopy +23

Scanning electrochemical mass sensitivity mapping of the quartz crystal microbalance in liquid media

Andrew C. Hillier, Michael D. Ward · Analytical Chemistry · 1992 · 176 citations

Engineering, Altmetric Attention Score, Chemistry +18

In-Situ Imaging of Ionic Crystal Dissolution Using an Integrated Electrochemical/AFM Probe

Julie V. Macpherson, Patrick R. Unwin, Andrew C. Hillier et al. · Journal of the American Chemical Society · 1996 · 156 citations

Engineering, Electrode-electrolyte Interface, Microscopy +18

Epitaxial interactions between molecular overlayers and ordered substrates

Andrew C. Hillier, Michael D. Ward · Physical review. B, Condensed matter · 1996 · 151 citations

Engineering, Chemistry, Molecular Beam Epitaxy +16

Nanoscale Imaging of Molecular Adsorption

Heng Cai, Andrew C. Hillier, Kevin R. Franklin et al. · Science · 1994 · 133 citations

Atomic Force Microscopy, Engineering, Microscopy +19