Daniel Kaminzky is an author at Intego (Germany) specializing in microelectronics, engineering, and quality control.
Top concepts
EngineeringApplied PhysicsOptoelectronicsQuality ControlDefect ToleranceMicroelectronicsOptical PropertiesElectrical Engineering
Publications per year
2015–2015
1
1
Imaging Defect Luminescence of 4H-SiC by Ultraviolet-Photoluminescence
Patrick Berwian, Daniel Kaminzky, Katharina Rosshirt et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2015 · 20 citations
Defect Tolerance, Electrical Engineering, Photoluminescence +14
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