Ryan Smith

System voltage potential-induced degradation mechanisms in PV modules and methods for test

Peter Hacke, Kent Terwilliger, Ryan Smith et al. · 2011 · 189 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Outdoor PV degradation comparison

Dirk Jordan, Ryan Smith, C.R. Osterwald et al. · 2010 · 80 citations · Full text

Engineering, Environmental Engineering, Power Electronics +16

17.8 A 190nW 33kHz RC oscillator with ±0.21% temperature stability and 4ppm long-term stability

Danielle Griffith, Per Torstein Roine, James N. Murdock et al. · 2014 · 79 citations

Engineering, Electrical Engineering, Low-power Design +13

Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress

Peter Hacke, Ryan Smith, Kent Terwilliger et al. · IEEE Journal of Photovoltaics · 2012 · 73 citations

Engineering, Electrical Engineering, Materials Science +17

Development of an IEC test for crystalline silicon modules to qualify their resistance to system voltage stress

Peter Hacke, Ryan Smith, Kent Terwilliger et al. · Progress in Photovoltaics Research and Applications · 2013 · 59 citations

Engineering, Electrical Engineering, Materials Science +17