Statistics
Publications
1
Citations
13
H-Index
1
Active since
2015
Affiliations
Applied Materials (Israel)(Current)
Shay Yasharzade is an author at Applied Materials (Israel) specializing in device scaling, electron microscopy, and critical dimension control.
Publications per year
2015–2015
1
1
Xiaoxiao Zhang, Patrick Snow, Alok Vaid et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015 · 13 citations
1–1 of 1