Statistics
Publications
5
Citations
145
H-Index
5
Active since
2012
Affiliations
Harbin Institute of Technology(Current)
Erming Rui is an author at Harbin Institute of Technology specializing in engineering, applied physics, and electrical engineering.
Publications per year
2012–2015
5
5
The equivalence of displacement damage in silicon bipolar junction transistors
Chaoming Liu, Xingji Li, Hongbin Geng et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2012 · 23 citations
Device Modeling, Electrical Engineering, Semiconductor Device +7
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