W. Z. He

Image deconvolution for defected crystals in field-emission high-resolution electron microscopy

W. Z. He, F.H Li, H Chen et al. · Ultramicroscopy · 1997 · 26 citations

Image Deconvolution, Engineering, Electron Microscopy +10

Amplitude correction in image deconvolution for determining crystal defects at atomic level

F. H. Li, D. Wang, W. Z. He et al. · Journal of Electron Microscopy · 2000 · 22 citations

Engineering, Si Crystal, Microscopy +22

Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM

Dong Wang, Jin Zou, W. Z. He et al. · Ultramicroscopy · 2003 · 19 citations

Misfit Dislocation Complex, Engineering, Image Deconvolution Technique +9

Multiple solution in maximum entropy deconvolution of high resolution electron microscope images

Dongli Huang, W. Z. He, F.H. Li · Ultramicroscopy · 1996 · 19 citations

High Resolution, Image Analysis, Engineering +15