Min Chul Chun

Effect of wake-up on the polarization switching dynamics of Si doped HfO2 thin films with imprint

Min Chul Chun, Sanghyun Park, Solmin Park et al. · Journal of Alloys and Compounds · 2020 · 20 citations

Engineering, Physics, Nanoelectronics +8

Highly stable, solution-processed quaternary oxide thin film-based resistive switching random access memory devices via global and local stoichiometric manipulation strategy

Dongyun Lee, Min Chul Chun, Hyungduk Ko et al. · Nanotechnology · 2020 · 14 citations

Negative capacitance phenomena depending on the wake-up effect in the ferroelectric Si:HfO2 film

Sanghyun Park, Min Chul Chun, Solmin Park et al. · Current Applied Physics · 2018 · 11 citations

Electrical Engineering, Engineering, Negative Capacitance Phenomena +9

Effect of annealing temperature on switching properties in Si-doped HfO2 films

Sanghyun Park, Min Chul Chun, Min Jin Kim et al. · Journal of Applied Physics · 2021 · 11 citations

Engineering, Chemistry, Ferroelectric Field-effect Transistors +18