M. O. Lampert

Temperature dependence of the reflectance of solid and liquid silicon

M. O. Lampert, J.M. Koebel, P. Siffert · Journal of Applied Physics · 1981 · 74 citations

Optical Materials, Solid Phase, Engineering +19

Advanced detection systems for X-ray fluorescence excitation spectroscopy

J. Goulon, Andreï Rogalev, G. Goujon et al. · Journal of Synchrotron Radiation · 2004 · 41 citations

On the use of thin ion implanted Si detectors in heavy ion experiments

L. Lavergne-Gosselin, L. Stab, M. O. Lampert et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1989 · 26 citations

Electrical Engineering, Ion Implantation, Engineering +10

Time-resolved reflectivity and melting depth measurements using pulsed ruby laser on silicon

M. Toulemonde, S. de Unamuno, R. Heddache et al. · Applied Physics A · 1985 · 24 citations

Depth Measurements, Time-resolved Reflectivity, Pulsed Ruby Laser +12

A high-resolution silicon drift chamber for X-ray spectroscopy

C. Gauthier, J. Goulon, E. Moguiline et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1994 · 21 citations

X-ray Spectroscopy, Engineering, Physics +2