Thomas J. Regan

Chemical effects at metal/oxide interfaces studied by x-ray-absorption spectroscopy

Thomas J. Regan, Hendrik Ohldag, C. Stamm et al. · Physical review. B, Condensed matter · 2001 · 586 citations

X-ray Spectroscopy, Engineering, Oxidation Resistance +22

Spectroscopic Identification and Direct Imaging of Interfacial Magnetic Spins

Hendrik Ohldag, Thomas J. Regan, J. Stöhr et al. · Physical Review Letters · 2001 · 239 citations

Engineering, Magnetic Resonance, Interfacial Magnetic Spins +18

Images of the Antiferromagnetic Structure of a NiO(100) Surface by Means of X-Ray Magnetic Linear Dichroism Spectromicroscopy

J. Stöhr, A. Schöll, Thomas J. Regan et al. · Physical Review Letters · 1999 · 204 citations

X-ray Crystallography, Magnetic Properties, X-ray Spectroscopy +24

Temperature dependence of magnetoresistance in spin valves with different thicknesses of NiO

Chih‐Huang Lai, Thomas J. Regan, Robert L. White et al. · Journal of Applied Physics · 1997 · 23 citations

Magnetic Properties, Engineering, Temperature Dependence +22

Exploring the microscopic origin of exchange bias with photoelectron emission microscopy (invited)

A. Schöll, F. Nolting, J. Stöhr et al. · Journal of Applied Physics · 2001 · 19 citations

Magnetic Properties, Engineering, Low-dimensional Magnetism +29