E. Talanova

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Active since

2004

Affiliations

E. Talanova is an author at Neocera (United States) specializing in defect-related failure analysis, semiconductor physics, and defects in electronic materials.

Publications per year

2004–2018

Publications

Non-Destructive 3D Failure Analysis Work Flow for Electrical Failure Analysis in Complex 2.5D-Based Devices Combining 3D Magnetic Field Imaging and 3D X-Ray Microscopy

Antonio Orozco, E. Talanova, Alex Jeffers et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2018 · 13 citations

Arts, Manufacturing Engineering, 3D Modeling +12

Failure analysis on resistive opens with Scanning SQUID Microscopy

Steve K. Hsiung, Kevan V. Tan, Andrew J. Komrowski et al. · 2004 · 11 citations

Engineering, Electrical Engineering, Materials Science +14

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