W. S. Ho

Characterization of IrO2 thin films by Raman spectroscopy

P.C. Liao, C.S Chen, W. S. Ho et al. · Thin Solid Films · 1997 · 101 citations

Natural Sciences, Materials Science, Physics +14

Characterization of sputtered iridium dioxide thin films

P.C. Liao, W. S. Ho, Y.S. Huang et al. · Journal of materials research/Pratt's guide to venture capital sources · 1998 · 34 citations

Natural Sciences, Materials Engineering, Materials Science +12

Characterization of RuO2 thin films deposited on Si by metal-organic chemical vapor deposition

P.C. Liao, S.Y. Mar, W. S. Ho et al. · Thin Solid Films · 1996 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +14