Danial Bahrami

Determination of indium content of GaAs/(In,Ga)As/(GaAs) core-shell(-shell) nanowires by x-ray diffraction and nano x-ray fluorescence

Ali Al Hassan, Ryan B. Lewis, Hanno Küpers et al. · Physical Review Materials · 2018 · 15 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Complete structural and strain analysis of single GaAs/(In,Ga)As/GaAs core–shell–shell nanowires by means of in-plane and out-of-plane X-ray nanodiffraction

Ali Al Hassan, Arman Davtyan, Hanno Küpers et al. · Journal of Applied Crystallography · 2018 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +17

Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging

Arman Davtyan, Thilo Krause, Dominik Kriegner et al. · Journal of Applied Crystallography · 2017 · 11 citations · Full text

Natural Sciences, Materials Science, Physics +17

Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Arman Davtyan, Sebastian Lehmann, Dominik Kriegner et al. · Journal of Synchrotron Radiation · 2017 · 10 citations · Full text

Natural Sciences, Materials Science, Physics +17

X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Arman Davtyan, Dominik Kriegner, V. Holý et al. · Journal of Applied Crystallography · 2020 · 10 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17