Cristián Vial-Edwards

Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

Bruno Guelorget, Manuel François, Cristián Vial-Edwards et al. · Materials Science and Engineering A · 2005 · 43 citations

Engineering, Strain Localization Onset, Microscopy +10

Whole-field analysis of uniaxial tensile tests by Moiré interferometry

Raúl R. Cordero, Manuel François, Ignacio Lira et al. · Optics and Lasers in Engineering · 2004 · 38 citations · Full text

Engineering, Strain Localization, Mechanical Engineering +5

Electronic speckle pattern interferometry analysis of tensile tests of semihard copper sheets

Cristián Vial-Edwards, Ignacio Lira, A. Martínez et al. · Experimental Mechanics · 2001 · 33 citations

Materials Science, Engineering, Mechanical Engineering +8

Strain and strain rate measurement during the bulge test by electronic speckle pattern interferometry

G. Montay, Manuel François, Marie Tourneix et al. · Journal of Materials Processing Technology · 2007 · 26 citations

Engineering, Strain Localization, Mechanics +11

The uncertainty of experimental derivatives: application to strain measurement

Ignacio Lira, Raúl R. Cordero, Manuel François et al. · Measurement Science and Technology · 2004 · 19 citations · Full text