Jiří Vohánka

Temperature-dependent dispersion model of float zone crystalline silicon

Daniel Franta, A. Dubroka, Chennan Wang et al. · Applied Surface Science · 2017 · 80 citations

Natural Sciences, Materials Engineering, Materials Science +13

Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model

Daniel Franta, Martin Čermák, Jiří Vohánka et al. · Thin Solid Films · 2017 · 41 citations

Natural Sciences, Physics, Condensed Matter Physics +10

Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers

Ivan Ohlı́dal, Jiří Vohánka, Vilma Buršı́ková et al. · Optics Express · 2019 · 29 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory

Ivan Ohlı́dal, Jiří Vohánka, Martin Čermák et al. · Applied Surface Science · 2017 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +17

Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region

Daniel Franta, Pavel Franta, Jiří Vohánka et al. · Journal of Applied Physics · 2018 · 18 citations

Natural Sciences, Materials Engineering, Materials Science +17