Alessandro Inglese

NUV-HD SiPMs with metal-filled trenches

S. Merzi, Stefan Brünner, A. Gola et al. · Journal of Instrumentation · 2023 · 50 citations

Engineering, Electrical Engineering, Diagnostic Imaging +16

Recombination activity of light-activated copper defects in <i>p</i>-type silicon studied by injection- and temperature-dependent lifetime spectroscopy

Alessandro Inglese, Jeanette Lindroos, Henri Vahlman et al. · Journal of Applied Physics · 2016 · 33 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Accelerated light-induced degradation for detecting copper contamination in <i>p</i>-type silicon

Alessandro Inglese, Jeanette Lindroos, Hele Savin · Applied Physics Letters · 2015 · 19 citations

Engineering, Electrical Engineering, Materials Science +17

Modeling of light-induced degradation due to Cu precipitation in p-type silicon. II. Comparison of simulations and experiments

Henri Vahlman, Antti Haarahiltunen, Wolfram Kwapil et al. · Journal of Applied Physics · 2017 · 19 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Impact of copper on light-induced degradation in Czochralski silicon PERC solar cells

Chiara Modanese, Mt. Wagner, Franziska Wolny et al. · Solar Energy Materials and Solar Cells · 2018 · 18 citations · Full text

Engineering, Materials Engineering, Materials Science +14