Statistics
Publications
5
Citations
136
H-Index
5
Active since
1998
Affiliations
Kris Frutschy is an author at GE Global Research (United States) specializing in x-ray detection, x-ray optics, and radiographic imaging.
Publications per year
1998–2010
5
5
Multi-source inverse-geometry CT: From system concept to research prototype
Bruno De Man, Antonio Caiafa, Yang Cao et al. · 2009 · 12 citations
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