R. Hill

A C₆₀ Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer et al. · Analytical Chemistry · 2003 · 535 citations

Engineering, Organic Electronics, Ion Beam Instrumentation +21

Development and experimental application of a gold liquid metal ion source

Noel W. Davies, Daniel E. Weibel, Paul Blenkinsopp et al. · Applied Surface Science · 2002 · 220 citations

Materials Science, Experimental Application, Engineering +7

Development of a C60+ ion gun for static SIMS and chemical imaging

S. C. Wong, R. Hill, Paul Blenkinsopp et al. · Applied Surface Science · 2002 · 146 citations

Static Sims, Ion Beam, Instrumentation +3

A new time‐of‐flight SIMS instrument for 3D imaging and analysis

R. Hill, Paul Blenkinsopp, Stephen Thompson et al. · Surface and Interface Analysis · 2010 · 73 citations

Engineering, Microscopy, Clinical Mass Spectrometry +26

The development of C60 and gold cluster ion guns for static SIMS analysis

R. Hill, Paul Blenkinsopp · Applied Surface Science · 2004 · 40 citations

Electrical Engineering, Engineering, Atomic Physics +4