Statistics
Publications
3
Citations
223
H-Index
3
Active since
2002
Affiliations
Matthew Moss is an author at Fraunhofer Institute for Material and Beam Technology specializing in semiconductor materials, semiconductor surfaces, and materials engineering.
Publications per year
2002–2003
3
3
Thermal stability of Mo/Si multilayers with boron carbide interlayers
Thomas Böttger, Dirk C. Meyer, P. Paufler et al. · Thin Solid Films · 2003 · 59 citations
1–3 of 3