Toshiyasu Tadokoro

Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements

Takashi Sato, Takeshi Araki, Yoshihiro Sasaki et al. · Applied Optics · 2007 · 83 citations

Engineering, Materials Engineering, Materials Science +16

Near-Field Raman Spectral Measurement of Polydiacetylene

Yoshihito Narita, Toshiyasu Tadokoro, Teruki Ikeda et al. · Applied Spectroscopy · 1998 · 43 citations

Natural Sciences, Chemistry, Materials Science +12

Observation of Nematic Liquid Crystal Director Reorientation at the Interface between Substrate and Liquid Crystal Layer by Total Reflection Ellipsometry

Satoshi Okutani, M. Kimura, Hirokazu Toriumi et al. · Japanese Journal of Applied Physics · 2001 · 29 citations

Natural Sciences, Materials Engineering, Materials Science +17

Approach for measuring complex refractive index of molten Sb2Te3 by spectroscopic ellipsometry

Masashi Kuwahara, Rie Endo, K. Tsutsumi et al. · Applied Physics Letters · 2012 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +15

Real Time Analysis of Liquid Crystal Surface Orientation Dynamics Using Polarization Modulated Spectroellipsometry

Toshiyasu Tadokoro, Tomoyuki Fukazawa Toriumi · Japanese Journal of Applied Physics · 1997 · 22 citations

Natural Sciences, Chemistry, Physics +16