S.-B. Lee

Three-Dimensional Characterization of Microstructure by Electron Back-Scatter Diffraction

Anthony D. Rollett, S.-B. Lee, Robert Campman et al. · Annual Review of Materials Research · 2007 · 158 citations

Materials Science, Engineering, Electron Microscopy +15

The heterophase interface character distribution of physical vapor-deposited and accumulative roll-bonded Cu–Nb multilayer composites

S.-B. Lee, J.E. LeDonne, Samuel Chao Voon Lim et al. · Acta Materialia · 2012 · 113 citations

Materials Science, Engineering, Material Property +4

Modeling the viscoplastic micromechanical response of two-phase materials using Fast Fourier Transforms

S.-B. Lee, Ricardo A. Lebensohn, Anthony D. Rollett · International Journal of Plasticity · 2010 · 89 citations

Materials Science, Engineering, Fast Fourier Transforms +12

Grain Boundary Character Distribution of Nanocrystalline Cu Thin Films Using Stereological Analysis of Transmission Electron Microscope Orientation Maps

Amith Darbal, K. J. Ganesh, Xiang-Yang Liu et al. · Microscopy and Microanalysis · 2013 · 46 citations

Interfacial orientation and misorientation relationships in nanolamellar Cu/Nb composites using transmission-electron-microscope-based orientation and phase mapping

Xiang-Yang Liu, Noel T. Nuhfer, Anthony D. Rollett et al. · Acta Materialia · 2013 · 44 citations

Materials Science, Nanolamellar Cu/nb Composites, Material Analysis +10