Detlef Bergmann

Characterization of nanoparticles by scanning electron microscopy in transmission mode

Egbert Buhr, N Senftleben, Tobias Klein et al. · Measurement Science and Technology · 2009 · 123 citations

Engineering, Materials Engineering, Materials Science +17

Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures

Mario Raab, Ija Jusuk, Julia Molle et al. · Scientific Reports · 2018 · 67 citations · Full text

Natural Sciences, Biophysics, Molecular Biology +17

Tip wear and tip breakage in high-speed atomic force microscopes

Timo Strahlendorff, Gaoliang Dai, Detlef Bergmann et al. · Ultramicroscopy · 2019 · 50 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Measurement of the detective quantum efficiency (DQE) of digital x-ray imaging devices according to the standard IEC 62220-1

Hartmut Illers, Egbert Buhr, Detlef Bergmann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 28 citations

Engineering, Radiology, Instrumentation +16

A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope

Gaoliang Dai, Jie Liu, Xiukun Hu et al. · Ultramicroscopy · 2021 · 24 citations

Natural Sciences, Materials Engineering, Materials Science +14