AI Kirkland

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering

A.J. D’Alfonso, E.C. Cosgriff, Scott D. Findlay et al. · Ultramicroscopy · 2008 · 59 citations

Engineering, Electron Microscopy, Medical Imaging +11

Deterministic electron ptychography at atomic resolution

A.J. D’Alfonso, Andrew J. Morgan, Ada W. C. Yan et al. · Physical Review B · 2014 · 58 citations

Engineering, Electron Microscopy, Physics +15

Aberration measurement using the Ronchigram contrast transfer function

Andrew R. Lupini, Peng Wang, P.D. Nellist et al. · Ultramicroscopy · 2010 · 48 citations

Adaptive Optic, Ophthalmology, Measurement +4

Direct Detectors for Electron Microscopy

R. Clough, Grigore Moldovan, AI Kirkland · Journal of Physics Conference Series · 2014 · 26 citations · Full text

Traditional Indirect Detectors, Engineering, Electron Microscopy +12

Hot STM of nanostructure dynamics on SrTiO₃(001)

H L Marsh, David S. Deak, Fabien Silly et al. · Nanotechnology · 2006 · 21 citations