The influence of defects on the Ni 2p and O 1s XPS of NiO

St. Uhlenbrock, C. Scharfschwerdt, M. Neumann, +2

Journal of Physics Condensed Matter

Materials EngineeringMaterials ScienceIi-vi SemiconductorEngineeringO 1S +12

Molecular adsorption on oxide surfaces: Electronic structure and orientation of NO on NiO(100)/Ni(100) and on NiO(100) as determined from electron spectroscopies and<i>ab initio</i>cluster calculations

H. Kuhlenbeck, G. Odörfer, R. Jaeger, +11

Physical review. B, Condensed matter

EngineeringVacuum DeviceChemistryElectronic StructureNanoelectronics +20

Adsorption and reaction of CO2 on Ni{110}: X-ray photoemission, near-edge X-ray absorption fine-structure and diffuse leed studies

Gerd Illing, D. Heskett, E. W. Plummer, +11

Surface Science

Materials ScienceX-ray SpectroscopyEngineeringPhotochemistryX-ray Diffraction +4

CO2 activation and reaction with hydrogen on Ni(110): formate formation

J. Wambach, Gerd Illing, H.‐J. Freund

Chemical Physics Letters

Materials ScienceInorganic ChemistryChemical EngineeringCo2 ActivationHydrogen Production +8

Frequency-Domain Optical Tomographic Imaging of Arthritic Finger Joints

Andreas H. Hielscher, Hyun Keol Kim, Ludguier D. Montejo, +6

IEEE Transactions on Medical Imaging

EngineeringOrthopaedic SurgeryOptical Tomographic ImagingOsteoarthritisBiostatistics +14

Adsorption of NO on an oxygen precovered Ni(100) surface

G. Odörfer, R. Jaeger, Gerd Illing, +2

Surface Science

Chemical EngineeringEngineeringCorrosionSurface AnalysisSurface Science +4

Laser Trepanning for Industrial Applications

David Ashkenasi, Tristan Kaszemeikat, N. Mueller, +3

Physics Procedia

Advanced Laser ProcessingLaser Processing (Laser Material Processing)EngineeringLaser TrepanningMicrofabrication +12

Ab initio localized electron calculations on solvated electron structures

Timothy Clark, Gerd Illing

Journal of the American Chemical Society

EngineeringAltmetric Attention ScoreBibliometricsElectron CalculationsComputational Chemistry +15

Influence of the defects of a thin NiO(100) film on the adsorption of NO

M. Bäumer, D. Cappus, Gerd Illing, +2

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

EngineeringReaction BehaviorHigh Defect DensityChemistrySemiconductors +17

X-ray polarimetry using the photoeffect in a CCD detector

G. Buschhorn, R. Kotthaus, W. Kufner, +14

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

PhysicsInstrumentationX-ray PolarimetryPolarization ImagingX-ray Optic +1