J. Vasi - Concepedia

Author

J. Vasi

Indian Institute of Technology Bombay ORCID

Also Known As

J Vasi, J. M. Vasi, J. Vasi, J.M. Vasi, Juzer M. Vasi, Juzer Vasi, L Smith, Mavilla, N.R., VASI, J, Yogeswara Rao Golive

208

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

Indian Institute of Technology Bombay University of California, Los Angeles Ministry of New and Renewable Energy Applied Materials (United States)National Institute of Solar Energy

About

J. Vasi is an author at Indian Institute of Technology Bombay specializing in electrical engineering, engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	50	1.4K
2	Applied Physics	17	32	682
3	Social Sciences	1	1	12
4	Chemistry	1	1	11
5	Civil Engineering	1	1	12

J. Vasi

Publications

1.5K

Citations

H-Index

Page 1

	Year	Citations
Photovoltaics at multi-terawatt scale: Waiting is not an option N. M. Haegel, Pierre Verlinden, Marta Victoria, Science Electrical EngineeringEngineeringMulti-terawatt ScaleEnergy EfficiencyEnergy Conversion	2023	210
Visual Degradation in Field-Aged Crystalline Silicon PV Modules in India and Correlation With Electrical Degradation Shashwata Chattopadhyay, Rajiv Dubey, Vivek Kuthanazhi, IEEE Journal of Photovoltaics Electrical EngineeringEngineeringEnergy EfficiencySolar PowerVisual Degradation Data	2014	99
Comprehensive study of performance degradation of field‐mounted photovoltaic modules in India Rajiv Dubey, Shashwata Chattopadhyay, Vivek Kuthanazhi, Energy Science & Engineering EngineeringEnergy EfficiencyHigher Degradation RatesPhotovoltaic DevicesPower Electronic Systems	2017	85
Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs Souvik Mahapatra, C.D. Parikh, V. Ramgopal Rao, IEEE Transactions on Electron Devices Device ModelingN-channel Ldd MosfetElectrical EngineeringEngineeringOxide-trapped Charge Distributions	2000	57
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs D.G. Borse, M. Rani KN, Niraj K. Jha, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringElectronic EngineeringBias Temperature InstabilityApplied Physics	2002	53
Analysis of Field Degradation Rates Observed in All-India Survey of Photovoltaic Module Reliability 2018 Yogeswara Rao Golive, Sachin Zachariah, Rajiv Dubey, IEEE Journal of Photovoltaics ReliabilityElectroluminescence ImagingElectrical EngineeringReliability EngineeringEngineering	2019	52
Performance degradation in field-aged crystalline silicon PV modules in different indian climatic conditions Rajiv Dubey, Shashwata Chattopadhyay, Vivek Kuthanazhi, EngineeringEnergy EfficiencyCrystalline Silicon ModulesPhotovoltaic SystemPhotovoltaic Power Station	2014	50
Correlating Infrared Thermography With Electrical Degradation of PV Modules Inspected in All-India Survey of Photovoltaic Module Reliability 2016 Shashwata Chattopadhyay, Rajiv Dubey, S. Bhaduri, IEEE Journal of Photovoltaics	2018	46
A comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique Souvik Mahapatra, C.D. Parikh, V. Ramgopal Rao, IEEE Transactions on Electron Devices Device ModelingComprehensive StudyElectrical EngineeringEngineeringStress-induced Leakage Current	2000	39
Experimental observation of avalanche multiplication in charge-coupled devices Siddharth Madan, Basabi Bhaumik, J. Vasi IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic Engineering	1983	39

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