Statistics
Publications
6
Citations
206
H-Index
6
Active since
1967
Affiliations
Siemens (Germany)(Current)
R. Weyl is an author at Siemens (Germany) specializing in physics, electron microscopy, and natural sciences.
Publications per year
1967–1979
6
6
Improvements in electron microscopy by application of superconductivity
I. Dietrich, F. Fox, E. Knapek et al. · Ultramicroscopy · 1976 · 85 citations
Reduction of radiation damage in an electron microscope with a superconducting lens system
I. Dietrich, H. Formanek, F. Fox et al. · Nature · 1979 · 48 citations
Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperature
I. Dietrich, F. Fox, H.G. Heide et al. · Ultramicroscopy · 1978 · 29 citations
High magnetic field gradient for electron microscopy
I. Dietrich, R. Weyl, H. Zerbst · Cryogenics · 1967 · 18 citations
Superconducting lenses in electron microscopy
I. Dietrich, E. Knapek, R. Weyl et al. · Cryogenics · 1975 · 16 citations
1–5 of 6