J.J.A.M. Vrakking

Quantitative aspects of Auger electron spectroscopy

F. Meyer, J.J.A.M. Vrakking · Surface Science · 1972 · 116 citations

Physics, Electron Spectroscopy, Natural Sciences +4

Detection limit including selectivity as a criterion for line selection in trace analysis using inductively coupled plasma-atomic emission spectrometry (ICP-AES)—a tutorial treatment of a fundamental problem of AES

P.W.J.M. Boumans, J.J.A.M. Vrakking · Spectrochimica Acta Part B Atomic Spectroscopy · 1987 · 84 citations

Analytical Instrumentation, Atomic Emission Spectroscopy, Natural Sciences +12

Ion beam epiplantation

Gary E. Thomas, L. Beckers, J.J.A.M. Vrakking et al. · Journal of Crystal Growth · 1982 · 83 citations

Electrical Engineering, Ion Beam, Instrumentation +2

The widths and shapes of about 350 prominent lines of 65 elements emitted by an inductively coupled plasma

P.W.J.M. Boumans, J.J.A.M. Vrakking · Spectrochimica Acta Part B Atomic Spectroscopy · 1986 · 82 citations

Engineering, Physics, Applied Physics +9

Ion-induced auger electron emission of Mg, Al and Si as a function of ion energy

J.J.A.M. Vrakking, A. Kroes · Surface Science · 1979 · 77 citations

Electrical Engineering, Ion Implantation, Engineering +8