David T. Lee

Electrospun PCL in Vitro: a Microstructural Basis for Mechanical Property Changes

Jed Johnson, Sylvain Nichols, David T. Lee et al. · Journal of Biomaterials Science Polymer Edition · 2009 · 69 citations

Engineering, Bioengineering, Biomedical Engineering +17

Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance

David T. Lee, J. P. Pelz, Bharat Bhushan · Review of Scientific Instruments · 2002 · 64 citations

Engineering, Electrical Engineering, Materials Science +17

Structure–function relationships and source-to-ground distance in electrospun polycaprolactone

Jeremy Gaumer, Aakrit Prasad, David T. Lee et al. · Acta Biomaterialia · 2009 · 60 citations

Natural Sciences, Materials Engineering, Materials Science +12

Approach to Determining In Situ Dielectric Constant of Pavements: Development and Implementation at Interstate 81 in Virginia

Samer Lahouar, Imad L. Al‐Qadi, Amara Loulizi et al. · Transportation Research Record Journal of the Transportation Research Board · 2002 · 60 citations

Engineering, Civil Engineering, Materials Characterization +8

Scanning capacitance microscopy for thin film measurements

David T. Lee, J. P. Pelz, Bharat Bhushan · Nanotechnology · 2006 · 41 citations

Natural Sciences, Materials Engineering, Materials Science +17