F. Vergand

Instrument for research on interfaces and surfaces

C. Bonnelle, F. Vergand, Philippe Jonnard et al. · Review of Scientific Instruments · 1994 · 69 citations

X-ray Spectroscopy, Engineering, Interface (Computing) +18

Hybridization of Al and O states in alpha- and gamma-alumina

M. Kefi, Philippe Jonnard, F. Vergand et al. · Journal of Physics Condensed Matter · 1993 · 28 citations

Materials Science, Inorganic Chemistry, Aluminium Nitride +15

IntriX: a numerical model for electron probe analysis at high depth resolution. Part II—tests and confrontation with experiments

Pierre-François Staub, P. Jonnard, F. Vergand et al. · X-Ray Spectrometry · 1998 · 26 citations

Engineering, Nuclear Physics, Microscopy +20

Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies

T.P. Nguyen, Philippe Jonnard, F. Vergand et al. · Synthetic Metals · 1995 · 25 citations

Materials Science, -Chromium Interface, Polymer Material +11

Spectroscopic characterization and reactivity study of ceria-supported nickel catalysts

E. Ramaroson, J.F. Tempère, M. F. Guilleux et al. · Journal of the Chemical Society Faraday Transactions · 1992 · 22 citations

Materials Science, Inorganic Chemistry, Chemical Engineering +11