Instrument for research on interfaces and surfaces

C. Bonnelle, F. Vergand, Philippe Jonnard, +9

Review of Scientific Instruments

X-ray SpectroscopyEngineeringInterface (Computing)Photon EnergyElectronic Structure +16

Hybridization of Al and O states in alpha- and gamma-alumina

M. Kefi, Philippe Jonnard, F. Vergand, +2

Journal of Physics Condensed Matter

Materials ScienceInorganic ChemistryAluminium NitrideTransition Metal ChalcogenidesX-ray Spectroscopy +13

IntriX: a numerical model for electron probe analysis at high depth resolution. Part II—tests and confrontation with experiments

Pierre-François Staub, P. Jonnard, F. Vergand, +2

X-Ray Spectrometry

EngineeringNuclear PhysicsMicroscopyElectron Probe AnalysisIon Beam Instrumentation +18

Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies

T.P. Nguyen, Philippe Jonnard, F. Vergand, +4

Synthetic Metals

Materials Science-Chromium InterfacePolymer MaterialEngineeringPara-phenylene Vinylene +9

Spectroscopic characterization and reactivity study of ceria-supported nickel catalysts

E. Ramaroson, J.F. Tempère, M. F. Guilleux, +3

Journal of the Chemical Society Faraday Transactions

Materials ScienceInorganic ChemistryChemical EngineeringCatalytic MaterialEngineering +9

Electron distribution in MgO probed by x-ray emission

Philippe Jonnard, F. Vergand, C. Bonnelle, +2

Physical review. B, Condensed matter

X-ray CrystallographyX-ray SpectroscopyEngineeringElectron DistributionTheoretical Inorganic Chemistry +15

Electron distribution of nickel particles encaged in x-zeolite

D. Fargues, F. Vergand, Esther Belin, +4

Surface Science

Materials ScienceMaterials EngineeringChemical EngineeringEngineeringElectron Distribution +2

Discontinuous transition in Yb and Eu atomic volume as a function of the grain size

C. Bonnelle, F. Vergand

Journal of Physics and Chemistry of Solids

Materials ScienceEngineeringPhysicsApplied PhysicsCondensed Matter Physics +7

Nickel 3d electron distribution of small particles embedded in SiO and of bulk nickel-SiO interface

D. Fargues, F. Vergand, C. Bonnelle

Surface Science

Materials ScienceEngineeringPhysicsElectron DistributionNanotechnology +8

Study of the Interface between Polyacrylonitrile Thin Films and a Nickel Cathode: Ni 3d States Analysed by EXES

Philippe Jonnard, F. Vergand, Pierre-François Staub, +4

Surface and Interface Analysis

X-ray SpectroscopyMetal 3DEngineeringChemistryPolyacrylonitrile Thin Films +18