C. Bainier

Near field microscopy and near field optics

D. Courjon, C. Bainier · Reports on Progress in Physics · 1994 · 308 citations

Engineering, Microscopy, Wave Optic +17

Nanostructuring lithium niobate substrates by focused ion beam milling

F. Lacour, Nadège Courjal, M.P. Bernal et al. · Optical Materials · 2004 · 126 citations · Full text

Materials Science, Ion Implantation, Engineering +6

Smallest lithographic marks generated by optical focusing systems

Thierry Grosjean, D. Courjon, C. Bainier · Optics Letters · 2007 · 69 citations · Full text

Optical Materials, Engineering, Microscopy +16

D.C. scanning thermal microscopy: Characterisation and interpretation of the measurement

Séverine Gomès, N. Trannoy, Philippe Grossel et al. · International Journal of Thermal Sciences · 2001 · 60 citations

Engineering, Microscopy, Thermal Microscopy +13

Surface morphology and thickness of a multilayer film composed of strong and weak polyelectrolytes: Effect of the number of adsorbed layers, concentration and type of salts

C.C. Buron, C. Filiâtre, F. Membrey et al. · Thin Solid Films · 2008 · 56 citations · Full text

Materials Science, Chemical Engineering, Engineering +10