S. Di Fonzo

Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light

F. Schäfers, H.-Ch. Mertins, A. Gaupp et al. · Applied Optics · 1999 · 216 citations

X-ray Spectroscopy, Engineering, Synchrotron Radiation Source +21

Non-destructive determination of local strain with 100-nanometre spatial resolution

S. Di Fonzo, W. Jark, S. Lagomarsino et al. · Nature · 2000 · 204 citations

Materials Science, Engineering, Strain Localization +6

Phase contrast hard x-ray microscopy with submicron resolution

S. Lagomarsino, Alessia Cedola, Peter Cloetens et al. · Applied Physics Letters · 1997 · 127 citations

High Resolution, X-ray Spectroscopy, Submicron Resolution +22

Evidence for a Crossover in the Frequency Dependence of the Acoustic Attenuation in Vitreous Silica

C. Masciovecchio, G. Baldi, Silvia Caponi et al. · Physical Review Letters · 2006 · 117 citations · Full text

Tunability experiments at the FERMI@Elettra free-electron laser

E. Allaria, Andrea Battistoni, Filippo Bencivenga et al. · New Journal of Physics · 2012 · 89 citations · Full text

Engineering, Laser Applications, Electron Optic +18