Statistics
Publications
2
Citations
29
H-Index
2
Active since
2007
LI Shi-lan is an author at National Engineering Research Center of Electromagnetic Radiation Control Materials specializing in materials science, ultrasonic testing, and scanning electron microscopy analysis.
Publications per year
2007–2009
2
2
Application of C-mode Scanning Acoustic Microscopy in Packaging
Lili Ma, Shengxiang Bao, Dechun Lv et al. · 2007 · 18 citations
Thin film thickness measurement using electron probe microanalyzer
Shengxiang Bao, Rong Wang, LI Shi-lan et al. · 2009 · 11 citations
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